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Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method, Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak


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Автор: Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak
Название:  Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method
ISBN: 9781786306876
Издательство: Wiley
Классификация:
ISBN-10: 1786306875
Обложка/Формат: Hardcover
Страницы: 288
Вес: 0.56 кг.
Дата издания: 06.04.2021
Язык: English
Размер: 23.39 x 15.60 x 1.75 cm
Читательская аудитория: Professional & vocational
Подзаголовок: Measurement systems, quantum engineering and rbdo method
Ссылка на Издательство: Link
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Поставляется из: Англии
Описание: Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power.

This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures.

This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master s students.


Quantum metrology with photoelectrons, volume ii: applications and advances

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1681746891 ISBN-13(EAN): 9781681746890
Издательство: Mare Nostrum (Eurospan)
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Цена: 56370.00 T
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Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Quantum metrology with photoelectrons, volume ii: applications and advances

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 76690.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

Автор: Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak
Название: Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
ISBN: 1786306409 ISBN-13(EAN): 9781786306401
Издательство: Wiley
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Цена: 145670.00 T
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Описание: To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications.

Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master s students.

Quantum metrology with photoelectrons, volume i: foundations

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681749998 ISBN-13(EAN): 9781681749990
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 92400.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Quantum metrology with photoelectrons, volume i: foundations

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681746859 ISBN-13(EAN): 9781681746852
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 72070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Characterization, Testing, Measurement, and Metrology

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
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Цена: 188850.00 T
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Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky
Название: Metrology and Theory of Measurement
ISBN: 3110284839 ISBN-13(EAN): 9783110284836
Издательство: Walter de Gruyter
Цена: 259100.00 T
Наличие на складе: Невозможна поставка.
Описание: Metrology is the science of measurements. It is traceable to measurement standards, thus to the concept of measurement accuracy, which is used in all natural and technical sciences, as well as in some fields of social sciences and liberal arts.The key problem is one of obtaining knowledge of the physical reality, which is observed through a prism of an assemblage of quantity properties describing the objectively-real world. One of the fundamental tasks of metrology is the development of theoretical and methodological aspects of the procedure of getting an accurate knowledge relating to objects and processes of the surrounding world.Due to the rapid development of information technologies and intelligent measurement systems and measuring instruments, as well as to the growing usage of mathematical methods in social and biological sciences, this monograph is dedicated to convey the fundamental theory.

Applied General Relativity: Theory and Applications in Astronomy, Celestial Mechanics and Metrology

Автор: Soffel Michael H., Han Wen-Biao
Название: Applied General Relativity: Theory and Applications in Astronomy, Celestial Mechanics and Metrology
ISBN: 3030196720 ISBN-13(EAN): 9783030196721
Издательство: Springer
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Цена: 55890.00 T
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Описание: The authors present up-to-date relativistic models for applied techniques such as Satellite LASER Ranging (SLR), Lunar LASER Ranging (LLR), Globale Navigation Satellite Systems (GNSS), Very Large Baseline Interferometry (VLBI), radar measurements, gyroscopes and pulsar timing.

Introduction to Metrology Applications in IC Manufacturing

Автор: Bo Su, Eric Solecky, Alok Vaid
Название: Introduction to Metrology Applications in IC Manufacturing
ISBN: 1628418117 ISBN-13(EAN): 9781628418118
Издательство: Mare Nostrum (Eurospan)
Цена: 55170.00 T
Наличие на складе: Невозможна поставка.
Описание: Metrology has grown significantly, especially in semiconductor manufacturing, and such growth necessitates increased expertise. Until now, this field has never had a book written from the perspective of an engineer in a modern IC manufacturing and development environment. The topics in this Tutorial Text range from metrology at its most basic level to future predictions and challenges, including measurement methods, industrial applications, fundamentals of traditional measurement system characterization and calibration, semiconductor-specific applications, optical metrology measurement techniques, charged particle measurement techniques, x-ray and in situ metrology, hybrid metrology, and mask making. The accompanying CD includes example spreadsheets of measurement uncertainty analysis—specifically, precision, matching, and relative accuracy.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VII
ISBN: 1510618457 ISBN-13(EAN): 9781510618459
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Nanometer CMOS RFICs for Mobile TV Applications

Автор: Ahmed A. Youssef; James Haslett
Название: Nanometer CMOS RFICs for Mobile TV Applications
ISBN: 9400732341 ISBN-13(EAN): 9789400732346
Издательство: Springer
Цена: 113180.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:

Preface. List of Symbols and Abbreviation.

Chapter One: Introduction and Overview. 1.1Mobile TV Architectures. 1.2 DVB-H Mobile TV System Definitions. 1.3 Scope of This Book.

Chapter Two: Wideband CMOS LNA Design Techniques. 2.1 Dynamic Range Limits in MOSFETs. 2.2 Traditional CMOS LNA Topologies. 2.3 Recent Trends in Wideband CMOS LNAs. 2.4 Techniques to Improve the Wideband LNA Dynamic Range. 2.5 Chapter Summary.

Chapter Three: Nanometer CMOS LNAs for Mobile TV Receivers. 3.1 Requirements of the LNA in Mobile TV Receivers. 3.2 A 65 nm CMOS Wideband LNA Prototype. 3.3 Experimental Results. 3.4 Chapter Summary.

Chapter Four: RF Attenuator Linearization Circuits. 4.1 The Necessity of RF Automatic Gain Control. 4.2 RF Gain Control System Analysis. 4.3 Highly Linear RF Front-End Architectures. 4.4 Design of the Binary Weighted RF Attenuator. 4.5 Practical Considerations. 4.6 A 65 nm CMOS RF Passive Attenuator. 4.7 Chapter Summary.

Chapter Five: Wide Dynamic Range Mobile TV Front-End Architecture. 5.1 Mobile TV Front-End with Automatic Gain Control. 5.2 A 65 nm CMOS RF Front-End Prototype. 5.3 Chapter Summary.

Chapter Six: Summary and Conclusions. 6.1 Summary and Conclusions. 6.2 Further Research Areas.

References. Index. Author Biographies.



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