Measurement, Testing and Sensor Technology, Czichos Horst

Автор: Horst Czichos
Название: Measurement, Testing and Sensor Technology
ISBN: 3030094766 ISBN-13(EAN): 9783030094768
Издательство: Springer
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Цена: 55890.00 T
Наличие на складе: Поставка под заказ.
Описание: This book presents the principles, methods and techniques to characterize materials and technical systems. The book is organized with concise text-graphics compilations in three parts:The first part describes the fundamentals of measurement, testing and sensor technology, including a survey of sensor types for dimensional metrology, kinematics, dynamics, and temperature. It describes also microsensors and embedded sensors.The second part gives an overview of materials and explains the application of measurement, testing and sensor technology to characterize composition, microstructure, properties and performance of materials as well as deterioration mechanisms and reliability.The third part introduces the general systems theory for the characterization of technical systems, exemplified by mechatronic and tribological systems. It describes technical diagnostics for structural health monitoring and performance control.

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
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Цена: 188850.00 T
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Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: Selahattin Sayil
Название: Contactless VLSI Measurement and Testing Techniques
ISBN: 3319888196 ISBN-13(EAN): 9783319888194
Издательство: Springer
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Цена: 93160.00 T
Наличие на складе: Поставка под заказ.
Описание: This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

Автор: Soubantika Palchoudhury
Название: Strategic Applications of Measurement Technologies and Instrumentation
ISBN: 1522554068 ISBN-13(EAN): 9781522554066
Издательство: Mare Nostrum (Eurospan)
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Цена: 163020.00 T
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Описание: Measurement techniques form the basis of scientific, engineering, and industrial innovations. The methods and instruments of measurement for different fields are constantly improving, and it’s necessary to address not only their significance but also the challenges and issues associated with them.Strategic Applications of Measurement Technologies and Instrumentation is a collection of innovative research on the methods and applications of measurement techniques in medical and scientific discoveries, as well as modern industrial applications. The book is divided into two sections with the first focusing on the significance of measurement strategies in physics and biomedical applications and the second examining measurement strategies in industrial applications. Highlighting a range of topics including material assessment, measurement strategies, and nanoscale materials, this book is ideally designed for engineers, academicians, researchers, scientists, software developers, graduate students, and industry professionals.

Автор: Kyung-Young Jhang
Название: Measurement of Nonlinear Ultrasonic Characteristics
ISBN: 9811514607 ISBN-13(EAN): 9789811514609
Издательство: Springer
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Цена: 167700.00 T
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Описание: Conventional ultrasonic methods based on ultrasonic characteristics in the linear elastic region are mainly sensitive to mature defects but are much less responsive to micro-damage or incipient material degradation.