Comparative Metric Semantics of Programming Languages, Franck van Breughel
Автор: Aldrich Winifred Название: Metric Pattern Cutting for Women`s Wear ISBN: 1444335057 ISBN-13(EAN): 9781444335057 Издательство: Wiley Рейтинг: Цена: 36960.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Metric Pattern Cutting for Women`s Wear provides a straightforward introduction to the principles of form pattern cutting for garments to fit the body shape, and flat pattern cutting for casual garments and jersey wear.
Автор: Alexander Zaslavski Название: Optimization on Metric and Normed Spaces ISBN: 0387886206 ISBN-13(EAN): 9780387886206 Издательство: Springer Рейтинг: Цена: 153720.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Covering recent work on Banach and complete metric spaces, this book uses the Baire approach and considers approximate solutions. It presents new results including penalty methods in constrained optimization and extant solutions in parametric optimization.
Автор: Lin Название: Generalized Metric Spaces and Mappings ISBN: 9462392153 ISBN-13(EAN): 9789462392151 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
The idea of mutual classification of spaces and mappings is one of the main research directions of point set topology. In a systematical way, this book discusses the basic theory of generalized metric spaces by using the mapping method, and summarizes the most important research achievements, particularly those from Chinese scholars, in the theory of spaces and mappings since the 1960s. This book has three chapters, two appendices and a list of more than 400 references. The chapters are 'The origin of generalized metric spaces', 'Mappings on metric spaces' and 'Classes of generalized metric spaces'.
Graduates or senior undergraduates in mathematics major can use this book as their text to study the theory of generalized metric spaces. Researchers in this field can also use this book as a valuable reference.
Автор: Aldrich Название: Metric Pattern Cutting for Women`s Wear ISBN: 1405175672 ISBN-13(EAN): 9781405175678 Издательство: Wiley Цена: 31670.00 T Наличие на складе: Поставка под заказ. Описание: "Metric Pattern Cutting for Women's Wear" was first published in 1975 to provide a straightforward introductory book for students beginning courses in flat
pattern cutting. The fifth edition continues to offer an introduction to the principles of pattern cutting, with a range of good basic blocks and examples of their application to garments.
However, the great expansion of casual wear, cut in jersey or stretch fabrics, has led to the growth of 'flat cutting' with no darting to create the shape and this edition devotes a whole
section to this type of cutting.
The sections on computer-aided design and grading have been updated. The size charts of body measurements have been revised, reflecting
the changing shape of women's bodies.
Автор: Mirka Danuta Название: Metric Manipulations in Haydn and Mozart: Chamber Music for Strings, 1787-1791 ISBN: 0199354081 ISBN-13(EAN): 9780199354085 Издательство: Oxford Academ Рейтинг: Цена: 28500.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Focusing on the period of most intense metric experimentation in the work of both Haydn and Mozart, author Danuta Mirka presents here a systematic discussion of the composers` metric strategies. Combining historical music theory with the cognitive study of music, Mirka`s award-winning book sheds new light on this repertoire and redefines the role of meter and rhythm in Classical music.
Автор: Xianzhe Dai; Xiaochun Rong Название: Metric and Differential Geometry ISBN: 3034807538 ISBN-13(EAN): 9783034807531 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The various contributions to this volume cover a broad range of topics in metric and differential geometry, including metric spaces, Ricci flow, Einstein manifolds, Kahler geometry, index theory, hypoelliptic Laplacian and analytic torsion.
Автор: Beer David Название: Metric Power ISBN: 113755648X ISBN-13(EAN): 9781137556486 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book examines the powerful and intensifying role that metrics play in ordering and shaping our everyday lives. Focusing upon the interconnections between measurement, circulation and possibility, the author explores the interwoven relations between power and metrics. He draws upon a wide-range of interdisciplinary resources to place these metrics within their broader historical, political and social contexts. More specifically, he illuminates the various ways that metrics implicate our lives – from our work, to our consumption and our leisure, through to our bodily routines and the financial and organisational structures that surround us. Unravelling the power dynamics that underpin and reside within the so-called big data revolution, he develops the central concept of Metric Power along with a set of conceptual resources for thinking critically about the powerful role played by metrics in the social world today.
Автор: Millman Richard S., Parker George D. Название: Geometry: A Metric Approach with Models ISBN: 0387201394 ISBN-13(EAN): 9780387201399 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Intended as a rigorous first course, the book introduces and develops the various axioms slowly, and then, in a departure from other texts, continually illustrates the major definitions and axioms with two or three models, enabling the reader to picture the idea more clearly.
Название: Thermodynamic tables in si (metric) units ISBN: 0521386934 ISBN-13(EAN): 9780521386937 Издательство: Cambridge Academ Рейтинг: Цена: 44350.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This updated book of thermodynamic tables for students is presented in the widely used SI (metric) unit system.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 174130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
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