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Integrated Circuit Failure Analysis, Beck
Integrated Circuit Failure Analysis

Автор: Beck
Название:  Integrated Circuit Failure Analysis   (Бек. Анализы отказа интегральной схемы)
Издательство: Wiley
Издательство: John wiley and sons ltd
Классификация:
Электронная техника

ISBN: 0471974013
ISBN-13(EAN): 9780471974017
ISBN: 0-471-97401-3
ISBN-13(EAN): 978-0-471-97401-7
Обложка/Формат: Hardback
Страницы: 190
Вес: 0.432 кг.
Дата издания: 19.01.1998
Серия: Wiley series in quality & reliability engineering
Язык: Eng
Иллюстрации: Index
Размер: 23.75 x 15.62 x 1.52 cm
Читательская аудитория: Postgraduate, research & scholarly
Рейтинг:
Описание: Examines the most important physical and chemical preparative methods and applications in semiconductor device analysis. The main focus of the book is on bipolar and MOS circuits but material is equally pertinent to the analysis of other kinds of components.
Описание: The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right.
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Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

Автор: Wai Kin Chim
Название: Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
ISBN: 047149240X ISBN-13(EAN): 9780471492405
Издательство: Wiley
Рейтинг:
Цена: 73330 T
Наличие на складе: Нет в наличии.
Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.

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Schaum`s Outline of Basic Circuit Analysis, Revised Second Edition

Автор: O`Malley John, O`Malley John
Название: Schaum`s Outline of Basic Circuit Analysis, Revised Second Edition
ISBN: 0071756434 ISBN-13(EAN): 9780071756433
Издательство: McGraw-Hill
Рейтинг:
Цена: 7030 T
Наличие на складе: Нет в наличии.

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Integrated Circuit Packaging, Assembly and Interconnections

Автор: Greig William J.
Название: Integrated Circuit Packaging, Assembly and Interconnections
ISBN: 0387281533 ISBN-13(EAN): 9780387281537
Издательство: Springer
Рейтинг:
Цена: 71960 T
Наличие на складе: Нет в наличии.
Описание: Reviewing the various IC packaging, assembly, and interconnection technologies, this professional guide and reference provides an overview of the materials and the processes, as well as the trends and available options, that encompass electronic manufacturing. It covers both the technical issues and touches on some of the reliability concerns with the various technologies applicable to packaging and assembly of the IC.The focus is on the electronic manufacturing process, which in its simplest form involves assembly of the IC into a package or interconnect substrate or board. The book discusses the various packaging approaches available, namely, single chip, multichip, and Chip On Board; the assembly options, chip & wire, tape automated bonding, and flip chip; and the essential high density package/substrate manufacturing technologies, thin film, thick film, cofired ceramic, and laminate printed wiring board (PWB) processes. Included also is a discussion of high density PWBs using build up/sequential processes.Integrated Circuit Packaging, Assembly and Interconnections is an introduction, a review and an update of packaging technologies.

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Failure Analysis of Integrated Circuits

Автор: Wagner
Название: Failure Analysis of Integrated Circuits
ISBN: 0412145618 ISBN-13(EAN): 9780412145612
Издательство: Springer
Рейтинг:
Цена: 86350 T
Наличие на складе: Нет в наличии.
Описание: Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique.

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Failure-free integrated circuit packages

Автор: Cohn, Charles Harper, Charles A.
Название: Failure-free integrated circuit packages
ISBN: 0071434844 ISBN-13(EAN): 9780071434843
Издательство: McGraw-Hill
Рейтинг:
Цена: 35200 T
Наличие на складе: Нет в наличии.
Описание: Gives you a visual reference on common failure modes of IC devices in organic packages. This title helps you: find, identify, and correct potential failures before they occur; improve device reliability; learn from case studies of IC package failure modes; locate failures through visual comparisons; and, apply failure analysis techniques.

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Analysis And Design of Digital Integrated Circuits

Автор: Hodges
Название: Analysis And Design of Digital Integrated Circuits
ISBN: 0071181644 ISBN-13(EAN): 9780071181648
Издательство: McGraw-Hill
Рейтинг:
Цена: 22290 T
Наличие на складе: Нет в наличии.

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Cmos Digital Integrated Circuits: Analysis And Design

Автор: Kang; Leblebici
Название: Cmos Digital Integrated Circuits: Analysis And Design
ISBN: 0071196447 ISBN-13(EAN): 9780071196444
Издательство: McGraw-Hill
Рейтинг:
Цена: 16890 T
Наличие на складе: Нет в наличии.
Описание: "CMOS Digital Integrated Circuits: Analysis and Design" is the most complete book on the market for CMOS circuits. Appropriate for electrical engineering and computer science, this book starts with CMOS processing, and then covers MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, BiCMOS circuits, I/O circuits, VLSI design methodologies, low-power design techniques, design for manufacturability, and design for testability. This book provides rigorous treatment of basic design concepts with detailed examples.

It typically addresses both the computer-aided analysis issues and the design issues for most of the circuit examples. Numerous SPICE simulation results are al o provided for illustration of basic concepts. Through rigorous analysis of CMOS circuits in this text, students will be able to learn the fundamentals of CMOS VLSI design, which is the driving force behind the development of advanced computer hardware.

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Distortion Analysis of Analog Integrated Circuits

Автор: Wambacq
Название: Distortion Analysis of Analog Integrated Circuits
ISBN: 0792381866 ISBN-13(EAN): 9780792381860
Издательство: Springer
Цена: 143920 T
Наличие на складе: Нет в наличии.
Описание: With the increased efforts of the analog design community to integrate analog high-frequency front-ends for telecommunications, there has been heightened interest in the behaviour of nonlinear circuits since this can cause considerable degradation of signals. In analog integrated circuits at lower frequencies, such as filters, nonlinear behaviour limits the dynamic range. Analog integrated circuit designers often lack insight into nonlinear circuit behaviour.

Indeed, designers are trained to reason in linear or linearized cir uits but not in nonlinear ones. Numerical circuit simulations of nonlinear circuit behavior do not provide enough insight to the designer. "Distortion Analysis of Analog Integrated Circuits", with a foreword by Robert G.

Meyer, provides both qualitative and quantitative insight into the nonlinear behavior of analog integrated circuits at low and high frequencies. General techniques to suppress nonlinear behavior such as pre-distortion, linear and nonlinear feedback are explained in detail and illustrated with realistic examples. In this way the book fills the gap between the theory of nonlinear systems and practical analog integrated circuits.

"Distortion Analysis of Analog Integrated Circuits" provides the reader with an in-depth analysis of elementary transistor stages, both CMOS and bipolar, as well as an analysis of several larger circuits. Hereby use is made of advanced transistor models that are also discussed in the book.The analyses take into account many more effects than in existing publications, thanks to the use of a calculation method that yields closed-form expressions for nonlinear behavior. These expressions are interpreted and illustrated with realistic numerical examples."Distortion Analysis of Analog Integrated Circuits" is essential reading for practicing analog and mixed-signal design engineers and researchers in the field.

It is also suitable as a text for an advanced course on the subject. From the foreword: 'I am sure that the analog circuit design community will [...] welcome this work by Dr. Wambacq and Prof.

Sansen as a major contribution to the analog circuit design literature in the area of distortion analysis of electronic circuits. I am personally looking forward to having a copy readily available for reference when designing integrated circuits for communication systems' - Robert G.Meyer, Professor, Electrical Engineering and Computer Sciences, University of California, Berkeley.

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Analysis and Design of Analog Integrated Circuits, 4th Edition

Автор: Paul R. Gray
Название: Analysis and Design of Analog Integrated Circuits, 4th Edition
ISBN: 0471321680 ISBN-13(EAN): 9780471321682
Издательство: Wiley
Рейтинг:
Цена: 53950 T
Наличие на складе: Нет в наличии.
Описание: The fourth edition features coverage of cutting edge topics-more advanced CMOS device electronics to include short-channel effects, weak inversion and impact ionization. In this resourceful book find: Coverage of state-of-the-art IC processes shows how modern integrated circuits are fabricated, including recent issues like heterojunction bipolar transistors, copper interconnect and low permittivity dielectric materials Comprehensive and unified treatment of bipolar and CMOS circuits helps readers design real-world amplifiers in silicon.

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Bipolar and MOS Analog Integrated Circuit Design

Автор: Alan B. Grebene
Название: Bipolar and MOS Analog Integrated Circuit Design
ISBN: 0471430781 ISBN-13(EAN): 9780471430780
Издательство: Wiley
Рейтинг:
Цена: 62770 T
Наличие на складе: Нет в наличии.
Описание: A practical, engineering book discussing the most modern and general techniques for designing analog integrated circuits which are not digital (excluding computer circuits). Covers the basics of the devices, manufacturing technology, design procedures, shortcuts, and analytic techniques. Includes examples and illustrations of the best current practice.

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Integrated Circuit Test Engineering

Автор: Grout
Название: Integrated Circuit Test Engineering
ISBN: 1846280230 ISBN-13(EAN): 9781846280238
Издательство: Springer
Цена: 43610 T
Наличие на складе: Нет в наличии.

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Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation / 13th International Workshop, PATMOS 2003, Torino, Italy, September 10-12, 2003, Proceedings

Автор: Chico Jorge Juan, Macii Enrico
Название: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation / 13th International Workshop, PATMOS 2003, Torino, Italy, September 10-12, 2003, Proceedings
ISBN: 3540200746 ISBN-13(EAN): 9783540200741
Издательство: Springer
Рейтинг:
Цена: 61590 T
Наличие на складе: Нет в наличии.

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